Paper
1 August 1990 Broadband optical monitoring of filters fabricated using molecular beam deposition
Shari Powell Fisher, Christopher C.H. Hale, Ian T. Muirhead, John Gordon H. Mathew, Robert J. Cornwell
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Proceedings Volume 1266, In-Process Optical Measurements and Industrial Methods; (1990) https://doi.org/10.1117/12.20260
Event: The International Congress on Optical Science and Engineering, 1990, The Hague, Netherlands
Abstract
A broadband optical monitoring system to assist with the control of complex filter designs has been implemented on a newly installed Molecular Beam Deposition (MBD) facility which has been adapted for the growth of optical thin films. When depositing a multilayer structure like a Fabry- Perot etalon with very narrow features whose location depends upon a precise optical thickness the broadband optical monitor is an essential addition to process control. In addition to providing the capability to observe the growth of a sensitive optical feature the broadband optical monitor is used to calibrate other process control methods. This saves a considerable amount of processing time and demonstrates the cost effectiveness of such a system. By the judicious use of broadband optical monitoring a very high degree of control and efficiency is added to MBD processing of optical thin films. 1.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shari Powell Fisher, Christopher C.H. Hale, Ian T. Muirhead, John Gordon H. Mathew, and Robert J. Cornwell "Broadband optical monitoring of filters fabricated using molecular beam deposition", Proc. SPIE 1266, In-Process Optical Measurements and Industrial Methods, (1 August 1990); https://doi.org/10.1117/12.20260
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KEYWORDS
Model-based design

Process control

Crystals

Calibration

Coating

Control systems

Multilayers

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