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The trap pumping technique has proven to be a powerful method of detecting and characterising single defects in the silicon lattice of radiation damaged Charge-Coupled Devices (CCDs). With the ever-increasing demand for improved accuracy of data from space telescopes, radiation damage calibration will play a big role for future space emissions. While current charge transfer inefficiency (CTI) correction algorithms are based on fitting parameters to EPER charge tails, trap pumping can provide more knowledge about the single defects creating these tails, and thus be used to improve the accuracy of the CTI calibration. Using data from an irradiated CCD monitored over a long period of time, we show which information can be gained from the trap pumping data and how the trap densities of different trap species can be used to inform the CTI calibration routines.
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Jesper M. Skottfelt, Zoe Lee-Payne, David J. Hall, Ben Dryer, "Comparison of trap pumping and EPER data," Proc. SPIE 12191, X-Ray, Optical, and Infrared Detectors for Astronomy X, 121910A (29 August 2022); https://doi.org/10.1117/12.2627483