Presentation + Paper
5 March 2022 Propagation loss measurements in sputter coated titanium oxide waveguides
Author Affiliations +
Abstract
TiO2 is a very promising material for integrated photonics due to its high refractive index (~2.3 at 633 nm), wide transparency window from the visible to the mid-infrared and high non-linear refractive index. However, to date, high propagation losses hinder its utilization in real-life applications. In this work, we carry out a systematic study of the different fabrication processes involved in the realization of TiO2 channel waveguides, including RF sputter deposition, electron-beam lithography and thermal annealing, showing film losses below 1 dB/cm for wavelengths above 633 nm and channel losses of 1-1.5 dB/cm at 1550 nm.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Aguirre Fontenla, I. Hegeman, W. A. P. M. Hendriks, C. E. Osornio-Martínez, M. Dijkstra, and S. M. García-Blanco "Propagation loss measurements in sputter coated titanium oxide waveguides", Proc. SPIE 12004, Integrated Optics: Devices, Materials, and Technologies XXVI, 1200403 (5 March 2022); https://doi.org/10.1117/12.2610616
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KEYWORDS
Waveguides

Microrings

Resonators

Titanium

Oxides

Channel waveguides

Refractive index

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