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22-27 January 2022 San Francisco, California, United States Sponsored and Published by SPIE Volume 12000 Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV, edited by Laurence P. Sadwick, Tianxin Yang, Proc. of SPIE Vol. 12000, 1200001 · © 2022 SPIE · 0277-786X · doi: 10.1117/12.2635666 The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org. The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon. Please use the following format to cite material from these proceedings: ISSN: 0277-786X ISSN: 1996-756X (electronic) ISBN: 9781510648715 ISBN: 9781510648722 (electronic) Published by SPIE P.O. Box 10, Bellingham, Washington 98227-0010 USA Telephone +1 360 676 3290 (Pacific Time) Copyright © 2022 Society of Photo-Optical Instrumentation Engineers (SPIE). Copying of material in this book for internal or personal use, or for the internal or personal use of specific clients, beyond the fair use provisions granted by the U.S. Copyright Law is authorized by SPIE subject to payment of fees. To obtain permission to use and share articles in this volume, visit Copyright Clearance Center at copyright.com. Other copying for republication, resale, advertising or promotion, or any form of systematic or multiple reproduction of any material in this book is prohibited except with permission in writing from the publisher. Printed in the United States of America by Curran Associates, Inc., under license from SPIE. Publication of record for individual papers is online in the SPIE Digital Library. Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:
SESSION 1 ANTENNAS
SESSION 4 SPECTROSCOPY AND RELATED TECHNOLOGIES
SESSION 7 INNOVATIONS IN THZ AND IR
SESSION 8 CHARACTERIZATION OF MATERIALS AND DEVICES
SESSION 9 THZ APPLICATIONS
Conference CommitteeSymposium Chairs Sonia M. García-Blanco, Universiteit Twente (Netherlands) Bernd Witzigmann, Friedrich-Alexander-Universität Erlangen-Nürnberg (Germany) Symposium Co-Chairs Sailing He, KTH Royal Institute of Technology (Sweden) and Zhejiang University (China) Yasuhiro Koike, Keio University (Japan) Program Track Chairs James G. Grote, Photonics Engineering Consultant (United States) Shibin Jiang, AdValue Photonics, Inc. (United States) Yakov Sidorin, Quarles & Brady LLP (United States) Jean-Emmanuel Broquin, IMEP-LACH (France) Conference Chairs Laurence P. Sadwick, InnoSys, Inc. (United States) Tianxin Yang, Tianjin University (China) Conference Program Committee René Beigang, Technische Universität Kaiserslautern (Germany) Jianji Dong, Huazhong University of Science and Technology (China) Frank Ellrich, Technische Hochschule Bingen (Germany) Fabian Friederich, Fraunhofer-Institut für Techno- und Wirtschaftsmathematik ITWM (Germany) Robert H. Giles, University of Massachusetts Lowell (United States) R. Jennifer Hwu, InnoSys, Inc. (United States) Mona Jarrahi, UCLA Samueli School of Engineering (United States) Karen K. Lin, A*STAR Institute of Materials Research and Engineering (Singapore) Daniel Molter, Fraunhofer-Institut für Techno- und Wirtschaftsmathematik ITWM (Germany) J. Anthony Murphy, National University of Ireland, Maynooth (Ireland) Créidhe O’Sullivan, National University of Ireland, Maynooth (Ireland) Kyung Hyun Park, Electronics and Telecommunications Research Institute (Korea, Republic of) Alessia Portieri, TeraView Ltd. (United Kingdom) Marco Rahm, Technische Universität Kaiserslautern (Germany) Jinghua Teng, A*STAR Institute of Materials Research and Engineering (Singapore) Michael Weibel, Joint Research and Development, Inc. (United States) Maddy Woodson, Freedom Photonics, LLC (United States) Jiangfeng Zhou, University of South Florida (United States) |