High-accuracy diffractometer for augmented reality waveguide characterization

Janne Simonen; Mikael Jokinen; Roosa Mäkitalo; Nikhil Pachhandara

doi:10.1117/12.2614766

7 March 2022 High-accuracy diffractometer for augmented reality waveguide characterization

Janne Simonen, Mikael Jokinen, Roosa Mäkitalo, Nikhil Pachhandara

Proceedings Volume 11931, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) III; 119310H (2022) https://doi.org/10.1117/12.2614766
Event: SPIE AR VR MR, 2022, San Francisco, California, United States

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Janne Simonen, Mikael Jokinen, Roosa Mäkitalo, and Nikhil Pachhandara "High-accuracy diffractometer for augmented reality waveguide characterization", Proc. SPIE 11931, Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) III, 119310H (7 March 2022); https://doi.org/10.1117/12.2614766

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