Presentation + Paper
1 August 2021 Infrared phase imaging using complex scattering media
Anwesh Bhattacharya, Pascal Berto, Valentina Krachmalnicoff, Ignacio Izeddin, Gilles Tessier, Yannick De Wilde
Author Affiliations +
Abstract
Infrared imaging finds numerous applications in airborne measurements, structural monitoring, medical diagnostics, and spectroscopy. Long wave infrared (LWIR) radiation (λ= 8-14 m) enables self-illuminated thermal imaging, and can uniquely identify different chemical species. The investigation of thermal emission control using plasmonic antenna devices,1 and the study of tunable free-form planar optics2 has motivated our development of a novel high-resolution thermal imaging technique. Speckle imaging has been successfully used to image optical intensity or phase through complex inhomogeneous scattering media - particularly at visible wavelengths,3 and recently in the infrared.4 Single-shot high-resolution images of the scattered light capture sufficient information to reconstruct images through opaque media and around corners with diffraction-limited resolution. In this context, we have developed a high-resolution broadband speckle imaging setup in the LWIR for phase reconstruction, using a thin scattering medium in front of an uncooled microbolometric camera. Our method utilizes the large angular memory effect of a thin scattering medium. Local phase gradients within the incoming beam produce distorted speckle images after scattering by the scatterer's surface. Local translation shifts between the speckle patterns are estimated by a fast diffeomorphic image registration algorithm to obtain a phase gradient map. Integrating this gradient map in 2-D finally yields the wavefront profile. We demonstrate infrared phase image reconstruction using our broadband LWIR speckle imaging methodology, which promises future applications in imaging through visually opaque objects like semiconductor circuits, solid-state nanoelectronics, and infrared optical components, for defect monitoring.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anwesh Bhattacharya, Pascal Berto, Valentina Krachmalnicoff, Ignacio Izeddin, Gilles Tessier, and Yannick De Wilde "Infrared phase imaging using complex scattering media", Proc. SPIE 11831, Infrared Sensors, Devices, and Applications XI, 118310I (1 August 2021); https://doi.org/10.1117/12.2593934
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KEYWORDS
Wavefronts

Scattering

Long wavelength infrared

Infrared imaging

Speckle pattern

Speckle

Thermography

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