Sky noise removal for submillimeter spectroscopy based on statistical methods

Akio Taniguchi; Yoichi Tamura; Kotaro Kohno; Shigeru Takahashi; Osamu Horigome; Jun Maekawa; Takeshi Sakai; Nario Kuno; Tetsuhiro Minamidani; Tom Bakx; Koyo Suzuki; Tatsuya Takekoshi; Takashi Tsukagoshi; Tai Oshima; Akira Endo; Kenichi Karatsu

doi:10.1117/12.2560908

13 December 2020 Sky noise removal for submillimeter spectroscopy based on statistical methods

Akio Taniguchi, Yoichi Tamura, Kotaro Kohno, Shigeru Takahashi, Osamu Horigome, Jun Maekawa, Takeshi Sakai, Nario Kuno, Tetsuhiro Minamidani, Tom Bakx, Koyo Suzuki, Tatsuya Takekoshi, Takashi Tsukagoshi, Tai Oshima, Akira Endo, Kenichi Karatsu

Author Affiliations +

Proceedings Volume 11453, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X; 1145339 (2020) https://doi.org/10.1117/12.2560908
Event: SPIE Astronomical Telescopes + Instrumentation, 2020, Online Only

Conference Poster

Abstract

Removing sky emission is essential to extract astronomical signals for submillimeter spectroscopy with ground-based single-dish telescopes, however, conventional switching methods not only cause baseline instability but result in low observing efficiency of on-source. Here we present two statistical approaches to efficient sky removal. For a heterodyne receiver, we develop an off-point-less observing method by a frequency-modulating local oscillator (FMLO; Taniguchi et al., PASJ, in press), which is three times more efficient than the conventional method. For an ultra-wideband spectrometer (DESHIMA; Endo et al. 2019a, 2019b), we develop a sky removal method applicable to continuum observations by using an atmospheric model.

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Akio Taniguchi, Yoichi Tamura, Kotaro Kohno, Shigeru Takahashi, Osamu Horigome, Jun Maekawa, Takeshi Sakai, Nario Kuno, Tetsuhiro Minamidani, Tom Bakx, Koyo Suzuki, Tatsuya Takekoshi, Takashi Tsukagoshi, Tai Oshima, Akira Endo, and Kenichi Karatsu "Sky noise removal for submillimeter spectroscopy based on statistical methods", Proc. SPIE 11453, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X, 1145339 (13 December 2020); https://doi.org/10.1117/12.2560908

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