Research on terahertz non-destructive testing technology for internal defects of insulation layer

Yuan Hou; Jing Xue; Guo Qi; Zhenwei Zhang

doi:10.1117/12.2555164

12 March 2020 Research on terahertz non-destructive testing technology for internal defects of insulation layer

Yuan Hou, Jing Xue, Guo Qi, Zhenwei Zhang

Proceedings Volume 11441, 2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications; 114410M (2020) https://doi.org/10.1117/12.2555164
Event: 2019 International Conference on Optical Instruments and Technology, 2019, Beijing, China

Abstract

In this study, terahertz non-destructive testing technology was used to insulation materials. The terahertz wave nondestructive testing was carried out to test the thickness of the layer, the air hole in the insulation layer and the defect of adiabatic structure. The refraction and absorption coefficients of terahertz wave in asbestos-filled nitrile rubber, aramid fiber-filled ethylene propylene diene monomer(EPDM) and silica-filled polyurethane rubber were studied. Two terahertz wave scanning imaging results were compared. Terahertz wave has a good penetrating ability to the insulation material and can be used to test the insulation layer thickness. At the same time, quality defects such as stratification and porosity of samples with a thickness of 2 mm can be identified. It is proved that terahertz technology can be applied to the detection of insulation materials and internal defects.

Citation Download Citation

Yuan Hou, Jing Xue, Guo Qi, and Zhenwei Zhang "Research on terahertz non-destructive testing technology for internal defects of insulation layer", Proc. SPIE 11441, 2019 International Conference on Optical Instruments and Technology: IRMMW-THz Technologies and Applications, 114410M (12 March 2020); https://doi.org/10.1117/12.2555164

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