A multi-dimensional evaluation method of the angle measurement performance for the transmitter

Zhenyu Zhang; Linghui Yang; Jiarui Lin; Shendong Shi; Jigui Zhu

doi:10.1117/12.2548311

12 March 2020 A multi-dimensional evaluation method of the angle measurement performance for the transmitter

Zhenyu Zhang, Linghui Yang, Jiarui Lin, Shendong Shi, Jigui Zhu

Proceedings Volume 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 1143918 (2020) https://doi.org/10.1117/12.2548311
Event: 2019 International Conference on Optical Instruments and Technology, 2019, Beijing, China

Abstract

This paper presents a multi-dimensional evaluation method of the angle measurement performance for the transmitter of the photoelectric scanning measurement network. As a distributed measurement system based on the multi-angle intersection, the accuracy of the angle measurement of the transmitter directly determines the measurement accuracy of the entire system. At present, there are few methods of evaluating the angle measurement performance for the transmitter. Multiple receivers are placed around the transmitter in a certain order and kept at the same level as much as possible. Based on circumferential closure and statistical knowledge, this method can evaluate the angle repeatability of different angle positions and the rotational speed volatility of the angular separations between adjacent receivers. The rotational speed volatility of the transmitter is important for the optimization of the angle measurement performance of the transmitter. Through experiments, we find that the method can reflect more information about the shafting, which can provide a good reference for the subsequent system upgrade.

Citation Download Citation

Zhenyu Zhang, Linghui Yang, Jiarui Lin, Shendong Shi, and Jigui Zhu "A multi-dimensional evaluation method of the angle measurement performance for the transmitter", Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1143918 (12 March 2020); https://doi.org/10.1117/12.2548311

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