Paper
13 September 2019 The output signal of the broadband differential interferometer as a function of the thickness of the single-mode optical waveguide
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Proceedings Volume 11204, 14th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods; 1120408 (2019) https://doi.org/10.1117/12.2536658
Event: Fourteenth Integrated Optics-Sensors, Sensing Structures and Methods Conference, 2019, Szcyrk-Gliwice, Poland
Abstract
The paper presents an analysis of planar broadband waveguide interferometers in the case of a change in layer thickness. The analysis was performed for the wavelength range of 450nm-1200nm. The TE0 and TM0 orthogonal modes which propagate in this wavelength range are considered. At the output of the system, an interference signal behind a polarizer can be recorded. If a spectrometer is used as a detector, the recorded signal is a function of the wavelength. Change in the change thickness of the waveguide layers results in a change of the recorded signal shape.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kazimierz Gut "The output signal of the broadband differential interferometer as a function of the thickness of the single-mode optical waveguide", Proc. SPIE 11204, 14th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 1120408 (13 September 2019); https://doi.org/10.1117/12.2536658
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Cited by 1 scholarly publication.
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KEYWORDS
Waveguides

Interferometers

Wave propagation

Refractive index

Light wave propagation

Single mode fibers

Planar waveguides

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