Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

Christian G. Schroer; Martin Seyrich; Andreas Schropp; Ralph Döhrmann; Stephan Botta; Patrik Wiljes; Dennis Brückner; Maik Kahnt; Felix Wittwer; Lukas Grote; Dorota Koziej; Jan Garrevoet; Gerald Falkenberg

doi:10.1117/12.2529096

9 September 2019 Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity

Christian G. Schroer, Martin Seyrich, Andreas Schropp, Ralph Döhrmann, Stephan Botta, Patrik Wiljes, Dennis Brückner, Maik Kahnt, Felix Wittwer, Lukas Grote, Dorota Koziej, Jan Garrevoet, Gerald Falkenberg

Author Affiliations +

Proceedings Volume 11112, X-Ray Nanoimaging: Instruments and Methods IV; 111120D (2019) https://doi.org/10.1117/12.2529096
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

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Christian G. Schroer, Martin Seyrich, Andreas Schropp, Ralph Döhrmann, Stephan Botta, Patrik Wiljes, Dennis Brückner, Maik Kahnt, Felix Wittwer, Lukas Grote, Dorota Koziej, Jan Garrevoet, and Gerald Falkenberg "Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III: signal-to-background optimization for imaging with high sensitivity", Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120D (9 September 2019); https://doi.org/10.1117/12.2529096

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