A test method of CMOS image sensors in dark field based on the genetic algorithm

Shan Cong; Dayu Zhang; Mingchao Chang; Qiang Wen

doi:10.1117/12.2512317

8 February 2019 A test method of CMOS image sensors in dark field based on the genetic algorithm

Shan Cong, Dayu Zhang, Mingchao Chang, Qiang Wen

Proceedings Volume 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging; 108431S (2019) https://doi.org/10.1117/12.2512317
Event: Ninth International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT2018), 2018, Chengdu, China

Abstract

A new kind of CMOS image sensor test method, which is different from test standards EMVA1288 and ESCC 25000， is proposed in this paper based on photo transfer theory by using the rough adaptive genetic algorithm (RAGA). This test method can measure both system gain and dark signal together by utilizing dark field grey value only in dark field. In this way the complexity of test is reduced, and high and low temperature tests and dynamic burn-in test become easy to be carried out. Without light field exposure, the stability and reliability of dark signal testing are improved in certain extent. The experiment result shows that, this new test method is available and dependable. It reduces the complexity of test equipment and environment, simplifies test flow, shortens test duration, and decreases test cost.

Citation Download Citation

Shan Cong, Dayu Zhang, Mingchao Chang, and Qiang Wen "A test method of CMOS image sensors in dark field based on the genetic algorithm", Proc. SPIE 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging, 108431S (8 February 2019); https://doi.org/10.1117/12.2512317

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