CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 10832 > Article
Paper
7 November 2018 Study on the echo of the optical imaging system under different extent of damage to CCD
Mingxin Zhang, Jinsong Nie, Yuntao Xie, Ke Sun, Xianan Dou
Author Affiliations +
Proceedings Volume 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications; 1083216 (2018) https://doi.org/10.1117/12.2511104
Event: Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 2018, Changchun, China
Abstract
In this paper, we establish the cat's eye echoes model of the optical imaging system under different damage conditions and analyze the influence of the damage to CCD layers on the cat's eye echo power. Based on this, the corresponding relationship between the echo power of the cat's eye and the damage degree of the CCD was established and verified by experiments. The results show that the field intensity is the strongest in the center of cat's eye echo in the imaging optics system, and the power of the echo increases dramatically and then decrease steeply and decrease slowly. The damaged status of CCD can be judged according to this rule. This study has certain reference value for the actual situation that the degree of the damage to CCD is required to be monitored in real time in the far field.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Mingxin Zhang, Jinsong Nie, Yuntao Xie, Ke Sun, and Xianan Dou "Study on the echo of the optical imaging system under different extent of damage to CCD", Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 1083216 (7 November 2018); https://doi.org/10.1117/12.2511104
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 10 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices
Silicon
Aluminum
Microlens
Transmittance
Imaging systems
Laser induced damage
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top