A Resolution Measurement Technique For Large Screen Displays

Harry Veron

doi:10.1117/12.952837

11 July 1989 A Resolution Measurement Technique For Large Screen Displays

Harry Veron

Proceedings Volume 1081, Projection Display Technology, Systems, and Applications; (1989) https://doi.org/10.1117/12.952837
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

This paper describes the use of a metric called modulation depth to successfully characterize the resolution of any large screen display (LSD). In addition, a measurement technique was developed to provide for an accurate and repeatable determination of modulation depth. Resolution measurements made on commercially available LSDs with this technique demonstrate its utility in both development and production environments. Finally, a linear systems analysis calculates the modulation depth seen by the observer as a function of distance from the projection screen. This calculation is then related to the actual measurements obtained from the LSDs. As a result of this work, the resolution metric and associated measurement technique should form the basis for an LSD industry standard.

Citation Download Citation

Harry Veron "A Resolution Measurement Technique For Large Screen Displays", Proc. SPIE 1081, Projection Display Technology, Systems, and Applications, (11 July 1989); https://doi.org/10.1117/12.952837

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available