Paper
26 April 2018 Dependence of the ellipsometric parameters of reflected light on the orientation of the optical axis relative to the plane of incidence
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Abstract
The reflection of linearly polarized light at the boundary of a plane anisotropic layer is considered, the optical axis of which is located arbitrarily in relation to the plane of incidence. Matrix amplitude coefficients of reflection and transmission of light by a plane anisotropic uniaxial layer are obtained, the energy coefficients of reflection, as well as ellipsometric parameters of the reflected light, and also their angular spectra.
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Natalya Michailovna Moiseeva and Anton Vladimirovich Moiseev "Dependence of the ellipsometric parameters of reflected light on the orientation of the optical axis relative to the plane of incidence", Proc. SPIE 10717, Saratov Fall Meeting 2017: Laser Physics and Photonics XVIII; and Computational Biophysics and Analysis of Biomedical Data IV, 1071717 (26 April 2018); https://doi.org/10.1117/12.2314585
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KEYWORDS
Polarization

Wave propagation

Radio propagation

Electromagnetic radiation

Picosecond phenomena

Anisotropy

Light wave propagation

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