CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 10540 > Article
Open Access Paper
26 January 2018 Understanding fundamental limitations of materials to enable advanced design
Meredith Reed, Jagmohan Bajaj, Francesco Bertazzi, Enrico Bellotti, Jonathan Schuster, Philip Perconti
Author Affiliations +
Proceedings Volume 10540, Quantum Sensing and Nano Electronics and Photonics XV; 1054005 (2018) https://doi.org/10.1117/12.2300711
Event: SPIE OPTO, 2018, San Francisco, California, United States
Abstract
Future and advanced sensor technologies needed for DoD applications will require more efficient semiconductor materials and devices. Pushing sensor device performance beyond present levels requires a deep understanding of the fundamental limiters. Therefore fundamental research is needed to assure transition of technology from demonstration to system deployment. To address this problem, the Army Research Laboratory (ARL) and Boston University (BU) have come together to create a BU led Consortium for semiconductor Modeling of Materials and Devices (CSM). The Consortium brings together government, academia, and industry in a collaborative fashion to continuously push semiconductor research forward to meet DoD needs. The leveraged attributes of the Consortium include combined broad knowledge base in semiconductor modeling, materials growth and device expertise; sharing of computational resources; project continuity; and extension of the bench. Details regarding the Consortium’s first research topic on understanding vertical transport in Type 2 SL will be discussed.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Meredith Reed, Jagmohan Bajaj, Francesco Bertazzi, Enrico Bellotti, Jonathan Schuster, and Philip Perconti "Understanding fundamental limitations of materials to enable advanced design", Proc. SPIE 10540, Quantum Sensing and Nano Electronics and Photonics XV, 1054005 (26 January 2018); https://doi.org/10.1117/12.2300711
PROCEEDINGS
 6 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Instrument modeling
Superlattices
Semiconductors
Mercury cadmium telluride
Long wavelength infrared
Scattering
Semiconductor materials
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top