Presentation
25 January 2018 Temporal diagnostics from photons: the experience with the PALM (Conference Presentation)
Pavle Juranic, Ishkhan Gorgisyan, Christian Erny, Rasmus Ischebeck, Luc Patthey, Claude Pradervand, Christopher J. Milne, H. Lemke, Andreas Dax, Milan Radovic, Christoph P. Hauri, Shigeki Owada, Tadashi Togashi, Tsukasa Katayama, Makina Yabashi
Author Affiliations +
Abstract
The Photon Arrival and Length Monitor (PALM), a THz streak camera device developed by PSI for non-destructive hard x-ray measurements of photon pulse length and arrival time versus a pump laser[1], was brought to the SACLA XFEL[2] in Japan in a cross-calibration temporal diagnostics campaign after an initial experiment where only the PALM was being used[3]. The device was used with 9 keV pink beam and a 9.0 and 8.8 keV two-color mode, successfully measuring the temporal ifnromation of the pulses for several different FEL operating conditions. The most interesting achievement is the PALM’s ability to measure two arrival times of the two colorors as tey are shifted against each other by the FEL, opening up new possibilities in temporal accuracy for two-color experiments. SwissFEL will employ two such devices at the end stations for use by both operators and experimenters to improve the operation of the FEL and to better interpret experimental data. References [1]P. N. Juranić et. al, Journal of Instrumentation (2014) 9. [2]T. Ishikawa et. al., Nature Photonics (2012) 6(8). [3] P. N. Juranić et. al., Optics Express (2014) 22.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavle Juranic, Ishkhan Gorgisyan, Christian Erny, Rasmus Ischebeck, Luc Patthey, Claude Pradervand, Christopher J. Milne, H. Lemke, Andreas Dax, Milan Radovic, Christoph P. Hauri, Shigeki Owada, Tadashi Togashi, Tsukasa Katayama, and Makina Yabashi "Temporal diagnostics from photons: the experience with the PALM (Conference Presentation)", Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 1023705 (25 January 2018); https://doi.org/10.1117/12.2269770
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