Paper
30 December 2016 III-Nitride advanced technologies and equipment for microelectronics
S. I. Petrov, A. N. Alexeev, V. V. Mamaev, D. M. Krasovitsky, V. P. Chaly
Author Affiliations +
Proceedings Volume 10224, International Conference on Micro- and Nano-Electronics 2016; 102241T (2016) https://doi.org/10.1117/12.2267146
Event: The International Conference on Micro- and Nano-Electronics 2016, 2016, Zvenigorod, Russian Federation
Abstract
Using of complex equipment SemiTEq shown in example of a closed cycle of basic technological operations for production of high-power field microwave transistors based on gallium nitride in the "Svetlana-Rost" JSC. Basic technological operations are shown: MBE growth of heterostructures, metal deposition of contacts using electron-beam evaporation system, thermal annealing of ohmic contacts, meza-isolation plasma-chemical etching and dielectric plasma deposition. The main problems during the technological route as well as ways to solve are discussed. In particular, ways to reduce the dislocation density in the active region of the transistor heterostructures grown on the mismatched substrates are described in detail. Special attention given to the homogeneity and reproducibility both after some manufacturing operations and applied to the end product.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. I. Petrov, A. N. Alexeev, V. V. Mamaev, D. M. Krasovitsky, and V. P. Chaly "III-Nitride advanced technologies and equipment for microelectronics ", Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102241T (30 December 2016); https://doi.org/10.1117/12.2267146
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Gallium nitride

Heterojunctions

Aluminum

Aluminum nitride

Metalorganic chemical vapor deposition

Resistance

Transistors

RELATED CONTENT

Theoretical Study of drain current of AlInN GaN HEMTs on...
Proceedings of SPIE (October 15 2012)
Formation of GaN film on Si for microbolometer
Proceedings of SPIE (May 31 2012)
AlGaN/SiC heterojunction bipolar transistor
Proceedings of SPIE (February 15 2008)
Millimeter-wave GaN HFET technology
Proceedings of SPIE (February 15 2008)
Insulator engineering in GaN-based MIS HFETs
Proceedings of SPIE (February 08 2007)

Back to Top