The evenness of ultra-thin tungsten wires under 10.1Vm is one of the most important technical indices, the ensuring of which being a difficult problem in technology yet to be solved by the manufacturers. The paper presents in concrete a proposal for real-time laser and microcomputer system for controlling the process of producing ultra-thin tungsten wires under 10μm, based on in-situ investigations and researches. Laser ultra-thin wire dynamic metering device of type JXD-1 worked out here was used in combination with electrolytic ultra-thin tungsten wire polishing installation in an integral system, fully ensuring quality of the products by realizing real-time monitor and control of processing through dynamic mea-surements of tungsten wire on line and closed-loop feedback.' The paper deals with the principles of measurement on line and real-time control by means of the system and precision analyses have been made, multiple compensation of errors, controlling tolerance zone and other measures to guarantee precision and stability of the entire system. It is concluded that evenness of diameter of wire over its entire length is kept assuredly within the tolerance range when the aforesaid system is used in the production of ultra-thin tungsten wires under 10 Atm.
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