Investigation Of Integrated Circuits By Holographic Technique

Ashraf H. Yahia; Nashwa M. Shaalan

doi:10.1117/12.952354

16 July 1986 Investigation Of Integrated Circuits By Holographic Technique

Ashraf H. Yahia, Nashwa M. Shaalan

Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952354
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France

Abstract

Double exposurs holographic technique is used for mapping the surface temperature distributions of an integrated circuit chip. The same results are obtained from the solution of Poisson's equation in two-dimensions to simulate these thermal fields.

Citation Download Citation

Ashraf H. Yahia and Nashwa M. Shaalan "Investigation Of Integrated Circuits By Holographic Technique", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); https://doi.org/10.1117/12.952354

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