In this study, we propose the concept of generating transient nonlinearity via nonlinear carrier lifetime variation based on Auger recombination in silicon nanostructures. The nonlinear Auger lifetime variation creates a common crossing point for all pump-probe transient traces at different pump fluences, presenting a fluence-independent property. Furthermore, we observe that sub-linear and super-linear responses exist before and after the crossing point, revealing an unconventional temporal tunability of Auger-induced transient nonlinearity. Leveraging the combination of a laser scanning microscope and pump-probe technique, these temporally transient nonlinear behaviors are applicable to spatial resolution enhancement beyond the diffraction limit.
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