Dr. Yongfeng Ju
at Univ of Electronic Science and Technology of China
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 October 2010 Paper
Yongfeng Ju, Zhiming Wu, Yonglong Qiu, Lin Li, Yadong Jiang
Proceedings Volume 7658, 76584K (2010) https://doi.org/10.1117/12.865917
KEYWORDS: Thin films, Resistance, Sputter deposition, Titanium, Thin film deposition, Oxides, Optical properties, Oxygen, Temperature metrology, Transmittance

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