Prof. Xiangqian Jiang Profile

Prof. Xiangqian Jiang

Professor at Univ of Huddersfield

SPIE Involvement:

Author

Publications (33)

Proceedings Article | 11 June 2024 Presentation

A metalens-based focus variation instrument exploiting focal plane scanning via illumination wavelength

Pengqian Yang, Haydn Martin, Andrew Henning, Xiangqian Jiang

Proceedings Volume PC12990, PC129900L (2024) https://doi.org/10.1117/12.3017153

KEYWORDS: Equipment, Light sources and illumination, Tunable filters, Reconstruction algorithms, Multi-element lenses, Microscopes, Materials properties, Light sources, Gallium nitride, Detection and tracking algorithms

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Proceedings Article | 6 June 2024 Poster

Metasurfaces as an enabling technology to realise ultra-compact sensors for manufacturing applications

J. H.-T. Chan, H. Martin, A. Henning, X. Jiang

Proceedings Volume PC12990, PC129901O (2024) https://doi.org/10.1117/12.3017142

KEYWORDS: Manufacturing, Sensors, Chromatic aberrations, Silica, Signal analyzers, Optical fibers, Metalenses, Lenses, Fiber couplers, Diffractive optical elements

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Proceedings Article | 27 November 2023 Paper

Error compensation for form errors of plate beamsplitter in near optical coaxial phase measuring deflectometry with reflection error model

Feng Gao, Yanling Li, Yongjia Xu, Zonghua Zhang, Yang Yu, Xiangqian Jiang

Proceedings Volume 12769, 127690K (2023) https://doi.org/10.1117/12.2686345

KEYWORDS: Beam splitters, Reflection, Phase measurement, Deflectometry, Optical testing, Specular reflections, Imaging systems, Shadows, Optical surfaces, Optical simulations

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Proceedings Article | 27 November 2023 Paper

Single-shot dispersive interferometry for inline surface inspection

Dawei Tang, Jian Wang, Tianqi Gu, Hussam Muhamedsalih, Tong Guo, Xiangqian Jiang

Proceedings Volume 12769, 127690T (2023) https://doi.org/10.1117/12.2687322

KEYWORDS: Optical interferometry, Metrology, Interferometry, Interferograms, Spectral calibration, Fringe analysis, Interferometers, Inspection, Cameras, Calibration

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Proceedings Article | 20 May 2022 Presentation

Metasurface-based ultracompact instrumentation to support future smart manufacturing

Andrew Henning, Daniel Townend, Haydn Martin, Xiang (Jane) Jiang

Proceedings Volume PC12137, PC1213706 (2022) https://doi.org/10.1117/12.2613336

KEYWORDS: Manufacturing, Sensors, Optics manufacturing, Wavefronts, Sensor technology, Optical testing, Optical components, Confocal microscopy, Waveguides, System integration

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The vision for the future of high value manufacturing, as embodied in ‘Industrie 4.0’, is one where autonomous ‘smart’ manufacturing processes are able to deliver bespoke products on-demand by deploying ‘right first-time’ fabrication techniques while aiding progression towards targets for waste reduction and carbon neutrality. While the vision is clear enough, the technical challenges associated with the realisation of autonomous manufacturing processes are substantial. Autonomous manufacturing requires measurement systems to be integrated much more closely with the manufacturing process than current sensor technologies allow, in order to generate the process feedback needed to ensure the workpiece being created meets its specification. It is predominantly the size and weight of conventional optical instrumentation that limit the potential for sensor integration either in-situ, on-machine or in-process. Recent advances in nanophotonics and specifically metasurface technology opens up a new route whereby a step-change reduction in size and weight of optical measurement systems can be achieved. Such systems will revolutionise the way optical measurement is deployed in manufacturing systems and represent a keystone technology upon which future manufacturing will evolve. We demonstrate the readiness of such metasurfaces to realise next-generation optical sensors through the example of a confocal microscope based on a single metasurface without the need for the additional optical elements found a conventional optical embodiment e.g. beamsplitters. The sensor concept is based on a metasurface consisting of two interlaced lenses, which focus independent off-axis points to a common point on the optical axis. We show how placing a point source and a point detector at these two off-axis points it is possible to realise an ultra-compact confocal sensor apparatus comprising a single optical element. Through this example we discuss the potential for a new generation of sensor technologies based on simplified optical assemblies which have great potential for both miniaturisation and cost-reduction.

Proceedings Article | 1 April 2020 Paper

Robustness improvement for the calibration of stereo deflectometry based on a search algorithm

Yongjia Xu, Feng Gao, Xiangqian Jiang

Proceedings Volume 11352, 113521I (2020) https://doi.org/10.1117/12.2552738

KEYWORDS: Calibration, Cameras, Deflectometry, Distortion, Imaging systems, Image processing, Fringe analysis, Optimization (mathematics), Metrology

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Proceedings Article | 7 March 2019 Paper

Corrected differential fitting for height extraction in chromatic confocal microscopy

Cheng Chen, WenJun Yang, Hong Zhu, Jian Fu, Chi Zhang, Jian Wang, XiaoJun Liu, Wenlong Lu, Xiangqian Jiang

Proceedings Volume 11053, 1105322 (2019) https://doi.org/10.1117/12.2511734

KEYWORDS: Error analysis, Confocal microscopy, Sensors, Algorithm development, Monte Carlo methods, Metrology

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Proceedings Article | 18 August 2018 Presentation + Paper

Single-shot RGB polarising interferometer

H. Muhamedsalih, S. Al-Bashir, F. Gao, X. Jiang

Proceedings Volume 10749, 1074909 (2018) https://doi.org/10.1117/12.2507354

KEYWORDS: Interferometers, RGB color model, Phase shifts, Polarization, Phase shifting, Linear polarizers, Cameras, Standards development, Optical filters, Interferometry

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Proceedings Article | 24 July 2018 Paper

Phase retrieval algorithm for line-scan dispersive interferometry

Dawei Tang, Prashant Kumar, Feng Gao, Xiangqian Jiang

Proceedings Volume 10827, 108270F (2018) https://doi.org/10.1117/12.2500918

KEYWORDS: Interferometry, Phase retrieval, Metrology, Fringe analysis, Light sources, Phase shifting, Fourier transforms, Interferometers

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SPIE Journal Paper | 28 March 2018

Accurate reconstruction in digital holographic microscopy using antialiasing shift-invariant contourlet transform

Xiaolei Zhang, Xiangchao Zhang, Min Xu, Hao Zhang, Xiangqian Jiang

OE, Vol. 57, Issue 03, 034108, (March 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.3.034108

KEYWORDS: Digital holography, Holography, Microscopy, Digital filtering, Optical filters, Speckle, Denoising, Optical engineering, Image filtering, Wavelets

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Proceedings Article | 13 June 2017 Paper

Full-field 3D shape measurement of specular object having discontinuous surfaces

Zonghua Zhang, Shujun Huang, Nan Gao, Feng Gao, Xiangqian Jiang

Proceedings Volume 10449, 104490T (2017) https://doi.org/10.1117/12.2270172

KEYWORDS: 3D imaging metrology, Fringe analysis, 3D metrology, Phase measurement, Deflectometry, 3D displays, Calibration, 3D acquisition, Mathematical modeling, 3D modeling, Visual process modeling, Projection systems

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Proceedings Article | 24 November 2016 Paper

Full-field 3D shape measurement of specular surfaces by direct phase to depth relationship

Zonghua Zhang, Yue Liu, Shujun Huang, Zhenqi Niu, Jiao Guo, Nan Gao, Feng Gao, Xiangqian Jiang

Proceedings Volume 10023, 100230X (2016) https://doi.org/10.1117/12.2246144

KEYWORDS: 3D metrology, Fringe analysis, Calibration, CCD cameras, Mathematical modeling, Mirrors, LCDs, Cameras, Beam splitters, Imaging systems

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Proceedings Article | 31 October 2016 Paper

Full-field calibration and compensation of lateral chromatic aberration based on unwrapped phase

Xiaohong Liu, Shujun Huang, Zonghua Zhang, Feng Gao, Xiangqian Jiang

Proceedings Volume 10021, 1002119 (2016) https://doi.org/10.1117/12.2245839

KEYWORDS: Cameras, Calibration, Chromatic aberrations, Fringe analysis, Computing systems, Imaging systems, 3D acquisition, 3D metrology, LCDs, Color difference

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Proceedings Article | 5 August 2015 Paper

In-situ defect detection systems for R2R flexible PV barrier films

F. Gao, H. Muhamedsalih, D. Tang, M. Elrawemi, L. Blunt, X. Jiang, S. Edge, D. Bird, P. Hollis

Proceedings Volume 9622, 96220E (2015) https://doi.org/10.1117/12.2193140

KEYWORDS: Inspection, Photovoltaics, Defect detection, Environmental sensing, Interferometry, Interferometers, Objectives, Manufacturing, Metrology, CCD cameras

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Proceedings Article | 3 December 2014 Paper

The research of 3D small-field imaging system based on fringe projection technique

Yanqin Yu, Shujun Huang, Zonghua Zhang, Feng Gao, Xiangqian Jiang

Proceedings Volume 9297, 92972D (2014) https://doi.org/10.1117/12.2073051

KEYWORDS: Fringe analysis, 3D metrology, Imaging systems, Microscopes, 3D image processing, Projection systems, CCD cameras, Digital Light Processing, Cameras, Phase measurement

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Proceedings Article | 24 November 2014 Paper

Projector calibration method based on optical coaxial camera

Lili Xie, Shujun Huang, Zonghua Zhang, Feng Gao, Xiangqian Jiang

Proceedings Volume 9301, 93012M (2014) https://doi.org/10.1117/12.2072858

KEYWORDS: Projection systems, Calibration, Cameras, Digital Light Processing, Fringe analysis, Beam splitters, Distortion, CCD cameras, Imaging systems, Computing systems

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Proceedings Article | 18 August 2014 Paper

Absolute height measurement of specular surfaces with modified active fringe reflection photogrammetry

Hongyu Ren, Xiangqian Jiang, Feng Gao, Zonghua Zhang

Proceedings Volume 9204, 920408 (2014) https://doi.org/10.1117/12.2060203

KEYWORDS: LCDs, Fringe analysis, Reflection, CCD cameras, Mirrors, Photogrammetry, Mathematical modeling, Charge-coupled devices, Imaging systems, Cameras

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Proceedings Article | 8 March 2014 Paper

Hybrid photonic chip interferometer for embedded metrology

P. Kumar, H. Martin, G. Maxwell, X. Jiang

Proceedings Volume 8988, 89880N (2014) https://doi.org/10.1117/12.2041761

KEYWORDS: Interferometers, Metrology, Glasses, Tunable lasers, Integrated optics, Waveguides, Photonic integrated circuits, Manufacturing, Optics manufacturing, Semiconductor lasers

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Proceedings Article | 31 January 2013 Paper

Three-dimensional measurement and characterization of grinding tool topography

Changcai Cui, Liam Blunt, Xiangqian Jiang, Xipeng Xu, Hui Huang, Ruifang Ye

Proceedings Volume 8759, 87590Q (2013) https://doi.org/10.1117/12.2015004

KEYWORDS: Surface finishing, Diamond, Abrasives, Photomicroscopy, Software development, Precision measurement, Microscopes, Manufacturing, Optical microscopes, Optical microscopy

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Proceedings Article | 27 May 2011 Paper

Comparison of fast Fourier transform and convolution in wavelength scanning interferometry

H. Muhamedsalih, X. Jiang, F. Gao

Proceedings Volume 8082, 80820Q (2011) https://doi.org/10.1117/12.889357

KEYWORDS: Convolution, Interferometry, Phase shifts, Charge-coupled devices, Fourier transforms, Surface finishing, Optical interferometry, Inspection, Interferometers, Halogens

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Proceedings Article | 28 December 2010 Paper

Categorical data model for cylindricity consistent with geometrical product specifications standard system

Wenlong Lu, Xiaojun Liu, Xiangqian Jiang, Qunfen Qi, Paul Scott

Proceedings Volume 7544, 75446S (2010) https://doi.org/10.1117/12.885276

KEYWORDS: Data modeling, Global Positioning System, System integration, Standards development, Tolerancing, Data storage, 3D imaging standards, Metrology, Manufacturing, Systems modeling

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Proceedings Article | 12 January 2009 Paper

Functions and three dimensional parameters of surface texture

Qunfen Qi, Xiaojun Liu, Xiangqian Jiang

Proceedings Volume 7133, 713303 (2009) https://doi.org/10.1117/12.811358

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Proceedings Article | 31 December 2008 Paper

Determining sample size in binary measurement system

Yan Zhao, Zhen He, Liam Blunt, Xiangqian Jiang, Yanlong Cao, Hongyu Zhang

Proceedings Volume 7130, 71305X (2008) https://doi.org/10.1117/12.819773

KEYWORDS: Binary data, Analytical research, Manufacturing, Mechanical engineering, Reliability, Data acquisition, Environmental sensing, Computing systems, Optical inspection, Statistical modeling

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Proceedings Article | 12 March 2008 Paper

Estimation of the measurement uncertainty based on quasi Monte-Carlo method in optical measurement

Hui Jing, Mei-fa Huang, Yan-ru Zhong, Bing Kuang, Xiang-qian Jiang

Proceedings Volume 6624, 66240Q (2008) https://doi.org/10.1117/12.791087

KEYWORDS: Monte Carlo methods, Optical testing, Statistical analysis, Computer simulations, Probability theory, Reliability, Imaging systems, Electrical engineering, Control systems, Computer engineering

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Proceedings Article | 30 October 2006 Paper

Knowledge structure of form specification of the next generation GPS information system

Wenlong Lu, Xiaojun Liu, Xiangqian Jiang, Zhengao Xu

Proceedings Volume 6358, 63585B (2006) https://doi.org/10.1117/12.718276

KEYWORDS: Global Positioning System, Manufacturing, Metrology, Standards development, Tolerancing, Fused deposition modeling, Communication engineering, Gaussian filters, System integration, Data acquisition

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Proceedings Article | 13 October 2006 Paper

Data modeling of the next generation GPS information system

Wenlong Lu, Xiaojun Liu, Xiangqian Jiang, Zhengao Xu

Proceedings Volume 6280, 628036 (2006) https://doi.org/10.1117/12.716346

KEYWORDS: Global Positioning System, Data modeling, Fused deposition modeling, System integration, Metrology, Manufacturing, Standards development, Systems engineering, Systems modeling, Data processing

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Proceedings Article | 13 October 2006 Paper

Comparison between ASME and ISO standards on surface texture

Kai Hu, Xiangqian Jiang, Xiaojun Liu, Zhengao Xu

Proceedings Volume 6280, 62801W (2006) https://doi.org/10.1117/12.716169

KEYWORDS: Standards development, Gaussian filters, Nonlinear filtering, Profiling, Manufacturing, Linear filtering, Surface finishing, Surface roughness, Digital filtering, Radium

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Proceedings Article | 13 October 2006 Paper

Evaluation and management of measurement uncertainty in the new generation geometrical product specification (GPS)

Heping Peng, Xiaojun Liu, Xiangqian Jiang, Zhengao Xu

Proceedings Volume 6280, 628038 (2006) https://doi.org/10.1117/12.716357

KEYWORDS: Global Positioning System, Temperature metrology, Standards development, Manufacturing, Calibration, Error analysis, Metrology, Quantization, Mechanical engineering, Quality measurement

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Proceedings Article | 16 September 2002 Paper

Pattern recognition for optical PSI images of surface topography using wavelets

Xiangqian Jiang, Shaojun Xiao, Liam Blunt

Proceedings Volume 4929, (2002) https://doi.org/10.1117/12.483206

KEYWORDS: Wavelets, Radon transform, Feature extraction, Wavelet transforms, Head, Continuous wavelet transforms, Discrete wavelet transforms, Radon, Optical pattern recognition, Image processing

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Proceedings Article | 22 September 1993 Paper

Design of a surface-roughness measuring sensor with high accuracy and wide dynamic range

Xiao Lu, Xiangqian Jiang, Tie-Bang Xie, Zhu Li

Proceedings Volume 2101, (1993) https://doi.org/10.1117/12.156461

KEYWORDS: Sensors, Surface roughness, Process control, Diamond, Mirrors, Lithium, Scientific research, Reliability, Corrosion, Electronic components

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Proceedings Article | 22 September 1993 Paper

Research on a new measuring and analyzing system for curved surface topography

Xiangqian Jiang, Ting-Xi Gu, Zhu Li

Proceedings Volume 2101, (1993) https://doi.org/10.1117/12.156374

KEYWORDS: Signal processing, Sensors, Interferometry, Analytical research, Data modeling, Diffraction gratings, Laser interferometry, Surface roughness, Mathematical modeling, Computer aided design

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Proceedings Article | 22 September 1993 Paper

Grating technology for topography measurement of curved surfaces

Xiangqian Jiang, Tie-Bang Xie, Cai-Xian Yao, Zhu Li

Proceedings Volume 2101, (1993) https://doi.org/10.1117/12.156502

KEYWORDS: Interferometry, Diffraction gratings, Beam splitters, Sensing systems, Mirrors, Wave plates, Reflectivity, Diffraction, Laser interferometry, Spatial frequencies

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Proceedings Article | 22 September 1993 Paper

New reference line for estimating roughness of an arbitrary curved surface

Shaojun Xiao, Xiangqian Jiang, Tie-Bang Xie

Proceedings Volume 2101, (1993) https://doi.org/10.1117/12.156319

KEYWORDS: Surface roughness, Statistical analysis, Radium, Error analysis, Statistical modeling, Mathematical modeling, Spherical lenses, Scientific research, Analytical research, Data processing

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Showing 5 of 33 publications

Conference Committee Involvement (3)

Optical Measurement Systems for Industrial Inspection XIII

26 June 2023 | Munich, Germany

Optical Measurement Systems for Industrial Inspection XII

21 June 2021 | Online Only, Germany

Optical Measurement Systems for Industrial Inspection XI

24 June 2019 | Munich, Germany

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