Wide-field reflection phase microscope

Zahid Yaqoob; Toyohiko Yamauchi; Dan Fu; Wonshik Choi; Ramachandra R. Dasari; Michael S. Feld

doi:10.1117/12.875877

23 February 2011 Wide-field reflection phase microscope

Zahid Yaqoob, Toyohiko Yamauchi, Dan Fu, Wonshik Choi, Ramachandra R. Dasari, Michael S. Feld

Proceedings Volume 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII; 79040T (2011) https://doi.org/10.1117/12.875877
Event: SPIE BiOS, 2011, San Francisco, California, United States

Abstract

Wide-field reflection phase microscopy is highly desired for depth-resolved measurement of cellular structures without the need for raster scanning. We report a low coherence reflection phase microscope based on time-domain optical coherence tomography and off-axis interferometry. The setup uniquely provides the desired angular shift to the reference beam for off-axis interferometry while promising equal path length across the whole reference beam. We show sub-nanometer path-length sensitivity of our instrument and demonstrate high-speed imaging of membrane fluctuations in eukaryotic cells.

Citation Download Citation

Zahid Yaqoob, Toyohiko Yamauchi, Dan Fu, Wonshik Choi, Ramachandra R. Dasari, and Michael S. Feld "Wide-field reflection phase microscope", Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79040T (23 February 2011); https://doi.org/10.1117/12.875877

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