Edge detection of grain image and algorithm of extra work

Yunshan Wang; Bin Qin; Shuchun Si

doi:10.1117/12.782694

17 January 2008 Edge detection of grain image and algorithm of extra work

Yunshan Wang, Bin Qin, Shuchun Si

Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 672307 (2008) https://doi.org/10.1117/12.782694
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

In order to get continuous and one-point-width of edge line, a method for noise-supprssion in accordance with rough extent of image is presented. After getting the edge lineby way of wavelets transform, a suit of improvements for edge line is established and adopted. Finally, a satisfied result is obtained with piece grain image segmented successfully.

Citation Download Citation

Yunshan Wang, Bin Qin, and Shuchun Si "Edge detection of grain image and algorithm of extra work", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672307 (17 January 2008); https://doi.org/10.1117/12.782694

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