Paper
4 March 2024 Validation method of error estimation of the metering device based on Monte Carlo simulation
Qingchan Liu, Yao Zhong, Cong Lin, Tengbin Li, Guangrun Yang, Junchao Chang
Author Affiliations +
Proceedings Volume 12981, Ninth International Symposium on Sensors, Mechatronics, and Automation System (ISSMAS 2023); 129815D (2024) https://doi.org/10.1117/12.3015193
Event: 9th International Symposium on Sensors, Mechatronics, and Automation (ISSMAS 2023), 2023, Nanjing, China
Abstract
At present, amid the error estimation analysis of metering devices in plants and stations, the model cannot be verified reasonably because of the sparsity of valid samples, and then the accuracy and applicability of the constructed model cannot be evaluated. To solve this problem, this paper proposes a method to verify the validity of error estimation of the metering device based on Monte Carlo simulation. By using the T-test, F-test, KS-test, and other statistical test methods to test and analyze the data distribution in the source data, Monte Carlo simulation technology is used to generate simulation data distributed with the real source data. On this basis, the out-of-tolerance samples under the simulation data and the real data are constructed to realize the effective verification of the model. The results show that the proposed validity verification method can reasonably compensate for and solve the problem that the model cannot be validated effectively owing to the sparsity of valid samples.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Qingchan Liu, Yao Zhong, Cong Lin, Tengbin Li, Guangrun Yang, and Junchao Chang "Validation method of error estimation of the metering device based on Monte Carlo simulation", Proc. SPIE 12981, Ninth International Symposium on Sensors, Mechatronics, and Automation System (ISSMAS 2023), 129815D (4 March 2024); https://doi.org/10.1117/12.3015193
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KEYWORDS
Data modeling

Monte Carlo methods

Statistical analysis

Error analysis

Computer simulations

Instrument modeling

Sampling rates

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