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27 March 2022 mK-level temperature measurement and control method for LWIR FPAs
Zhanlei Jin, Xiang Ye, Lina Xu, Li Song, Zhihong Liu, Yanhua Zhao, Tingting Zhang, Yunfei Xu, Na Yuan, Haoqian Li, Lida Sun
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Proceedings Volume 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications; 12169DQ (2022) https://doi.org/10.1117/12.2628006
Event: Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 2021, Kunming, China
Abstract
Due to LWIR FPAs is sensitive to ambient temperature, A new coarse and fine compound temperature measure and control method is presented for mK-level measure and control accuracy target of 12.5 um IR FPAs. Coarse measurement and control method is used in non-imaging period, and fine measurement and control method with low-drift precision temperature measurement circuit is used to achieve mK-level measure and control accuracy. Temperature drift model of precision temperature measurement circuit is established, and temperature drift contrast is done between traditional temperature measurement circuit and precision temperature measurement circuit. Experiment results show that the measurement precision of compound temperature measure and control method reaches 3mK and control precision reaches 8mK.
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Zhanlei Jin, Xiang Ye, Lina Xu, Li Song, Zhihong Liu, Yanhua Zhao, Tingting Zhang, Yunfei Xu, Na Yuan, Haoqian Li, and Lida Sun "mK-level temperature measurement and control method for LWIR FPAs", Proc. SPIE 12169, Eighth Symposium on Novel Photoelectronic Detection Technology and Applications, 12169DQ (27 March 2022); https://doi.org/10.1117/12.2628006
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KEYWORDS
Temperature metrology
Precision measurement
Long wavelength infrared
Amplifiers
Black bodies
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